BS EN BRITISH STANDARD 60749:1999 IEC 60749: 1996 Incorporating Amendments Nos. 1 and 2 Semiconductor devices . Mechanical and climatic test methods The European Standard EN 60749:1999, with the incorporation of amendments A1:2000 and A2:2001, has the status of a British Standard ICS 31.080.01 BSi NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTEDBY COPYRIGHT LAW British Standards BS EN 60749:1999 BSI National foreword This British Standard is the English language version of EN 60749:1999, including amendments A1:2000 and A2:2001. It is identical with IEC 60749:1996, Edition 2.2:2002, which comprises Edition 1.0:1996 consolidated by the incorporation of amendments 1:2000 and 2:2001. It supersedes BS 6493-3:1985 which was withdrawn 0n 2000-04-01. Sidelining in this document indicates the changes made by amendments London South Bank University, Sat Dec 30 06:24:07 GMT+00:00 2006, I A1:2000 and A2:2001. The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductor devices, which has the responsibility to: aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; - monitor related international and European developments and promulgate them in the UK. A list of organizations represented on this committee can be obtained on request to its secretary. From 1 January 1997, all IEC publications have the number 60000 added to the old number.Forinstance,IEC 27-1has beenrenumberedasIEC60027-1. For a period of time during the change over from one numbering system to the other, publications may contain identifiers from both systems. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index", or by using the “Search" facility of the BSI Electronic Catalogue or of British Standard Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not ofitself confer immunity from legal obligations. This British Standard, having been prepared under the direction of the Summary of pages Universit Electrotechnical Sector This document comprises a front cover, an inside front cover, the EN title page, Committee,was published under the authority pages 2 to 76, an inside back cover and a back cover. of the Standards Committee and comes into effect on The BSI copyright notice displayed in this document indicates when the Bank 15 April 1999 document was last issued. C BSI 23 September 2002 Licensed Copy: London South E Amendments issued since publication Amd. No.Date Comments 13129 September 2001 See national foreword 13694 23 September 2002 See national foreword ISBN 0 580 32151 7 EUROPEAN STANDARD EN 60749 BSI , Uncontrolled Copy, (c) E January 1999 NORME EUROPEENNE +Ai EUROPAISCHE NORM November 2000 + A2 December 2001 ICS 31.080.01 Descriptors: Semiconductors, climatic tests, mechanical tests Licensed Copy: London South Bank University, London South Bank University, Sat Dec 30 06:24:07 GMT+00:00 2006, L English version Semiconductor devices Mechanical and climatic test methods (includes amendments A1:2000 and A2:2001) (IEC 60749:1996 + A1:2000 + A2:2001) Dispositifs a semiconducteurs - Halbleiterbauelemente Essais mécaniques et climatiques Mechanische und klimatische (inclut les amendements A1:2000 et A2:2001) Prufverfahren (CEI 60749:1996 +A1:2000 + A2:2001) (enthalt Anderungen A1:2000 und A2:2001) (IEC 60749:1996 + A1:2000 + A2:2001) This European Standard was approved by CENELEC on 1999-01-01. Amendment Al:2000 was approved by CENELEC on 2000-09-01 and amendment A2:2001 was approved by CENELEC on 2001-12-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regula